High resolution, low noise, digital SWIR camera

The OWL 640 SWIR is a rugged, high sensitivity digital SWIR camera, using a 640 x 512 InGaAs sensor enabling high-sensitivity imaging from 0.9µm to 1.7µm. The 15µm x 15µm pixel pitch enables the highest resolution SWIR image and with less than 39 electrons readout noise.

Available with a Camera Link output, the OWL 640 Digital will run up to 120Hz, enabling high-speed digital video with intelligent Automated Gain Control (AGC). This new on-board AGC will enable clear video in all light conditions.

owl 320
Sensor TypeInGaAs PIN-Photodiode
Active Pixel640 x 512
Pixel Pitch15µm x 15µm
Active Area9.6mm x 7.68mm
Spectral response0.9μm to 1.7μm
Noise (RMS)<195 electrons Low Gain (176 electrons typical), <50 electrons High Gain (39 electrons typical)
Quantum Efficiency> 70% from 1μm to 1.6μm
Pixel Well DepthLow Gain: 1.4Me-, High Gain: 43Ke
Pixel Operability>99.5%
Digital Output Format14 bit CameraLink (Base Configuration)
Exposure time1µs to 1 / frame rate
Shutter modeGlobal shutter
Frame RateUp to 120Hz programmable, 25ns resolution
Optical InterfaceC mount
Trigger interfaceTrigger IN and OUT - TTL compatible
Power supply12V DC ±10%
TE CoolingActive
Image Correction3 point NUC (offset, Gain & Dark Current) + pixel correction
Functions controlled by serial communicationExposure, intelligent AGC, Non Uniformity Correction, Gamma, Pk/Av, TEC, ROI
Camera Power Consumption< 3.5W (TEC OFF, NUC ON) <4W (TEC ON in ambient, NUC ON)
Operating Case Temperature20˚C to +55˚C
Storage Temperature-30˚C to +60˚C
Dimensions50mm x 50mm x 82mm


  • 860, 1064 & 1550nm laser line detection
  • Active Imaging
  • Airborne Payload
  • Hand Held Goggles
  • Imaging through Fog
  • Range Finding
  • Vision enhancement


  • Astronomy
  • Beam Profiling
  • Hyperspectral Imaging
  • Semiconductor Inspection
  • Solar Cell Inspection
  • Thermography